Wayne Kerr 6550P/B1 Binning Option for the 6550P 20Hz - 50MHz High Frequency Digital LCR Meter (Cannot be fitted together with the 6550P/B2).

Accuracy and versatility makes the Wayne Kerr 6550P 20Hz - 50MHz High Frequency Digital LCR Meter the ideal choice for many different tasks and applications in the area of manufacturing test. The wide range of frequency specifications means that a customer can select the model which best meets their requirements and budget.

AC Measurement parameters: Impedance (Z)

Phase Angle (Ø)

Capacitance (C)

Dissipation Factor (D)

Inductance (L)

Quality Factor (Q)

Resistance (R)

Reactance (X)

Conductance (G)

Susceptance (B)

Admittance (Y)

High measurement accuracy

Capacitance, inductance and impedance basic accuracy are all an excellent ±0.05%. Dissipation factor accuracy is ±0.0005 and the quality factor accuracy is ±0.05%.

Variable drive and bias levels: AC drive levels up to 1V or 20mA can be selected to evaluate components in realistic operating environments. /D1 DC bias option provides 0 to +40Vdc bias voltage and 0 to +100mAdc bias current. /D2 DC bias option provides -40V to +40Vdc bias voltage.

External control: The GPIB interface is used to control the instrument and read back measured values for applications such as quality control or for archiving purposes.

An Ethernet interface similarly allows the instrument to be controlled and to send out data, allowing it to be integrated into many test environments.

Wide range of interfaces: An external monitor or projector may be connected to the instrument’s VGA output. The ability to provide a large screen display of measurement results is invaluable in production environments or for teaching and training.

Instrument control from both a keyboard and mouse is available. Any keyboard or mouse, with either PS/2 or USB interfaces, can be simply connected to provide an alternative method of instrument control and operation.

Data storage and retrieval: All measurement and setup data can be stored using the Ethernet interface or a USB flash memory (supplied as standard).

Setup Data: Up to 20 instrument setups may be locally stored.

Bin handling: /B1 option (non-isolated 5V) or /B2 option (isolated 24V) signals are available through a 25-way D-type connector. 10 bins can be set using absolute or percentage limits.

Printer outputs: Hard copy printouts can be obtained in a number of ways including direct to an HP-PCL compatible graphics printer or Epson compatible text/ticket printer. A networked HP-PCL compatible printer may also be used via the Ethernet connection.

Component connections: Four front panel BNC connectors permit three or four terminal connections with the screens at ground potential.

The 1J1011 Component Fixture, supplied with all models, ensures optimum performance when measuring a wide range of leaded components and devices.

The 1J1011 Component Fixture, supplied with all models, ensures optimum performance when measuring a wide range of leaded components and devices.

Protection against charged capacitors: High precision measuring instruments can be damaged by charged capacitors which can cause costly repairs and unacceptable downtime. All the models in the range incorporate protection against charged capacitors.

Comprehensive and precise component tests at higher frequencies: The Wayne Kerr 6550P is best summarized by "Comprehensive and precise component tests at higher frequencies". The instrument is the perfect solution for those who have demanding component measurement needs.