The Teledyne LeCroy T3DSO4204L-HD Low Profile Oscilloscope features 4 channels (1U High) and an analog bandwidth of 2 GHz. The low profile form factor combined with 12-bit high resolution ADCs - and low noise front end - provides an impressive noise performance to cover a wide range of measurement applications. It offers a maximum sample rate of 10 GS/s per channel and a maximum memory depth of 500 Mpts.

High-resolution to meet high precision test requirements - When compared to waveforms acquired and displayed using conventional 8-bit oscilloscopes, waveforms captured with 12-bit technology are cleaner and provides more signal detail. This is helpful for wide dynamic range signals in which a full-scale signal must be acquired, while at the same time very small amplitude signal details must be analyzed.

High performance front-end - The noise floor value is: 153 μVrms at full bandwidth of 2 GHz; 125 μVrms at bandwidth of 1 GHz

High waveform update rate - With a waveform update rate of up to 170,000 wfm/s, the T3DSO4204L-HD oscilloscope can easily capture unusual or low-probability events. In Sequence mode, the waveform capture rate can reach 750,000 wfm/s.

Superb DC gain accuracy - A typical DC Gain Accuracy 0.5% combined with low noise floor provides the capability to perform sensitive measurement required for a wide range of applications.

Deep record length - Using a hardware-based Zoom technique and set record length, users can select a slower time base without compromising the sample rate, and then quickly zoom in to focus on the area of interest.

Multiple trigger functions - Edge, Slope, Pulse, Video, Windows, Runt, Interval, Dropout, Pattern, Qualified, Nth edge, Setup/ hold, Delay, and serial trigger

Advanced math function - In addition to the traditional (+, -, X, /) operations, FFT, integration, differential, square root, and more are supported. The Formula Editor feature is available for more complex operations; four math traces are also available.

Hardware-accelerated FFT provides high-frequency resolution with a fast refresh rate. The FFT function also supports a variety of window functions so that it can adapt to different spectrum measurement needs. Three modes (Normal, Average, and Max hold) can satisfy different requirements for observing the power spectrum. Auto peak detection and markers are supported.

History mode - The history function can record up to 80,000 frames of waveforms. The recording is executed automatically so that the customer can playback the history waveforms at any time to observe unusual events and quickly locate the area of interest using cursors or measurements. The failed frames of the Mask Test can be stored as history frames.

Trigger zone - Trigger Zone is available for advanced triggering.

Sequence mode - Segmented memory collection will store the waveform into multiple memory segments and each segment will store a triggered waveform as well as the dead time information. The interval between segments can be as small as 1.3 μs. All of the segments can be played back using the History function.

Search and navigate - The oscilloscope can search events specified by the user in a frame. Events flagged by the Search can be recalled automatically using Navigate. It can also navigate by time (delay position) and history frames.

Parameter statistics function - Statistics show the current value, maximum value, minimum value, standard deviation, and mean value of up to 12 parameters simultaneously. A histogram is available to show the probability distribution of a parameter. Trend and Track are available to show the parameter value vs. time.

For horizontal parameters such as period, all results are extracted from a frame, instead of just calculating the first one. This accelerates statistics on horizontal measurements much more and enables distribution observation in a frame using Histogram and Track.

Hardware-based mask test function - The oscilloscope utilizes a hardware-based Mask Test function, performing up to 18,000 Pass/Fail decisions each second. It is easy to generate user defined test templates to provide trace mask comparisons, making it suitable for long-term signal monitoring or automated production line testing. The built-in Mask Editor application helps to create custom masks.

Eye/Jitter analysis - This oscilloscope supports eye diagram and jitter analysis/measurement. It can automatically extract the embedded reference clock from serial data and create an eye diagram. Measurement on multiple eye/jitter parameters is provided, and mask testing of eye diagrams is supported.

Power analysis - The Power Analysis application provides a full suite of power measurement and analysis tools. These tools enable an improvement in the efficiency of measurements made on switching power supplies and power devices. The Power Analysis application can measure Power Quality, Current Harmonics, Inrush Current, Switching Loss, Slew Rate, Modulation, Output Ripple, Turn On/ Turn Off, Transient Response, PSRR and Efficiency. Each measurement has a help screen showing a connection diagram with notes.