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Keithley Instruments 2450

Graphical SourceMeter (SMU) Instrument with GPIB, USB, and Ethernet Interfaces

2450KEITHLEY
2450

Keithley Instruments 2450

Graphical SourceMeter (SMU) Instrument with GPIB, USB, and Ethernet Interfaces

2450KEITHLEY
2450

The Keithley 2450 200V/1A/20W Advanced Touchscreen SourceMeter SMU Instrument truly brings Ohm's law (current, voltage, and resistance) testing right to your fingertips. Its innovative graphical user interface (GUI) and advanced, capacitive touchscreen technology allow intuitive usage and minimize the learning curve to enable engineers and scientists to learn faster, work smarter, and invent easier.

  • Capability of analyzers, curve tracers, and I-V systems
This product is available for shipping to the US, Canada, and Puerto Rico only.
$8,250.00
This item ships FREE
In stock: 3 Units
  • Capability of analyzers, curve tracers, and I-V systems at a fraction of the cost
  • 200V, 1A, 20W
  • Five-inch, high resolution capacitive touchscreen GUI
  • 0.012% basic measure accuracy with 6 1/2-digit resolution
  • Enhanced sensitivity
  • Source and sync (4-quadrant) operation
  • Four "Quickset" modes for fast setup and measurements
  • Built-in, context-sensitive front panel help
  • Front panel input banana jacks
  • Rear panel input triaxial connections
  • 2450 SCPI and TSP scripting programming modes
  • Model 2400 SCPI-compatible programming mode
  • Front panel USB memory port for data/programming/configuration I/O

Applications:

  • Nanomaterials and devices
  • Graphene
  • Carbon nanotubes
  • Nanowires
  • Low power nanostructures
  • Semiconductor structures
  • Wafers
  • Thin films
  • Organic materials and devices
  • E-inks
  • Printable electronics
  • Energy efficiency and lighting
  • LEDs/AMOLEDs
  • Photovoltaics/solar cells
  • Batteries
  • Discrete and passive components
  • Two-leaded resistors, diodes, zener diodes, LEDs, disk drive heads, and sensors
  • Three-leaded small signal bipolar junction transistors (BJTs), field effect transistors (FETs) (and more)
  • Material characterization
  • Resistivity
  • Hall effect