Hioki 3506-10

Name: Hioki 3506-10 Dual-band Capacitance Meter,1kHz/1MHz for High Speed Testing of Ceramic Capacitors on Production Lines
Brand: Hioki
SKU: 350610
Price: 5390.0 USD
Availability: InStock

Our Part No. 350610

Mfr. Model 3506-10

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Hioki 3506-10

Our Part No. 350610

Mfr. Model 3506-10

The Hioki 3506-10 Dual-Band Capacitance Meter is designed to be integrated with automatic taping machines and sorters for production of MLCC (multi-layer ceramic capacitors). The 3506-10 delivers higher measurement speeds in FAST mode and an improvement by a factor of approximately 7 in repeatability for measurement of minuscule capacitance values in high-noise environments.

High-speed analog test time of 0.6 ms (at 1 MHz)

This product is available for shipping to the US, Canada, and Puerto Rico only.

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$5,390.00

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Key Features

High-speed analog test time of 0.6 ms (at 1 MHz)
Improved noise resistance and enhanced repeatability in measurement precision even for production lines
1 kHz and 1 MHz measurement frequency supports stable low capacitance testing with taping machines
BIN function, for easy component screening

Details

The Hioki 350610 is a dual-band capacitance meter designed to be integrated with automatic taping machines and sorters for production of MLCC (multi-layer ceramic capacitors).

The 3506-10 delivers higher measurement speeds in FAST mode and an improvement by a factor of approximately 7 in repeatability for measurement of minuscule capacitance values in high-noise environments. These characteristics make the instrument ideal for embedded measurement in taping machines, sorters, and other automatic systems.

A self-calibration function minimizes variations in measurement values due to changes in ambient temperature. In addition, the cable-length-compensation function minimizes measurement errors when the measurement cable is extended from 1 to 2 meters (using 1.5D-2V cable).

Contact errors while measuring can be detected by the Chatter Detection function, Low-C Reject function, Current Detection Circuit Monitoring function and the Applied Voltage Value Monitoring function. Yield rates are improved by judging measurement-object contact errors as ERR instead of FAIL.

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