Agilent 4291B
RF Impedance / Material Analyzer, Refurbished

• Four component test fixtures (DUT size: 0.5 mm to 20 mm)
• Independent parameter selection in 2 channels
• Direct read-out permittivity, permeability (option)
• Two material fixtures (operating temperature: -55˚ C to +200˚s C)
• Versatile analysis (temperature, cole-cole plot, relaxation time)
• Sweep parameters (frequency, ac level, dc bias, temperature)

Basic impedance accuracy is +/- 0.8%. High Q accuracy enables low-loss component analysis. An internal synthesizer sweeps frequency from 1 MHz to 1.8 GHz with 1 mHz resolution. A 1.8-m error-less cable connects the analyzer to a test station so you can extend your test point away from the analyzer without losing accuracy. Advanced calibration and error compensation function eliminate measurement error factors in fixtures and assure high accuracy and repeatability at DUT/MUT.

Agilent 4291B also provides automatic level control and monitor of test signals by using IBASIC programming function; devices can be measured under a constant voltage or current. Measure bias dependent impedance characteristics with optional dc bias (up to 40 V and 100 mA). At the push of a button, the built-in Equivalent Circuit Analysis Function automatically calculates the circuit constant values of five circuit models.

Agilent 4291B has two measurement channels; each channel can be set to measure a single (e.g. Z) or dual (e.g. Z-theta) impedance parameter. The color TFT with split-display can show both active traces and memory traces (stored in RAM). A built-in floppy disk drive stores programs and test data in either LIF or MS-DOS format. With built-in IBASIC, you can control external test equipment such as a temperature chamber or wafer prober directly from the Agilent 4291B. You do not need a separate instrument controller.

Material Evaluation

HP / Agilent 4291B enables easy and sophisticated material evaluation and improves material evaluation quality and efficiency. The Agilent 4291B provides the total dielectric/magnetic material measurement solutions in wide frequency range (1 MHz to 1 GHz).