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<< HP 4285A
Product PageHewlett Packard 4285A
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| Parameters Measured | |Z|-q,
|Y|-q, R-X, G-B C-D, Q, ESR, G, Rp L-D, Q, ESR, G, Rp Deviation and % deviation |
| Measurement Circuit Modes | Series and parallel |
| Ranging | Auto and manual |
| Trigger | Internal, external, and manual |
| Delay Time | 0 to 60.000s in 1 ms steps |
| Measurement Terminals | Four-terminal pair |
| Test Cable Length | 0, 1 and 2 m |
| Integration Time | Short, medium, and long |
| Averaging | 1 to 256, programmable |
| Test Signal | 75 kHz to 30 MHz ± 0.01%, 100-Hz steps |
| Test Signal Modes | |
| Normal | Programs selected voltage or current at the measurement terminals open or shorted, respectively, and not at the device under test. |
| Constant | Maintains selected voltage or current at the device under test independent of changes in the device's impedance. |
| Test Signal Levels (rms) | Normal: 5 mV to 2V, 200 µA to
20 mA Constant: 10 mV to 1V, 100 µA to 20 mA |
| DC Bias | 0V to ± 40V |
| Measurement Display Range | |
| Parameter | Range |
| |Z|, R, X | 0.01 mΩ to 99.9999 MΩ |
| |Y|, G, B | 0.01 nS to 99.9999 S |
| C | 0.01 fF to 999.999 µF |
| L | 0.001 nH 99.9999 H |
| D | 0.000001 to 9.99999 |
| Q | 0.01 to 99999.9 |
| q | -180.000° to 180.000° |
| D% | -999.999% to 999.999% |
| Basic Measurement Accuracy | |Z|, C, L: 0.1% D: 0.001 @ 23° ± 5° C, after OPEN and SHORT correction |
| SUPPLEMENTAL CHARACTERISTICS | |
| Measurement Time | Typical measurement time from the trigger command to the end of measurement (EOM) output at the handler interface connector. |
| 75 kHz to 30 MHz | Short: 30 ms Medium: 65 ms Long: 200 ms |
| Option 001 DC Bias Current Output | 100 mA max |
| DISPLAY | |
| LCD dot-matrix display | Displays measured values, control settings, comparator limits and decisions, list sweep tables, self-test messages, and annunciations. |
| CORRECTION FUNCTION | |
| Zero OPEN/SHORT | Eliminates measurement errors due to the test fixture's stray parasitic impedance |
| Load | Improves measurement accuracy by using a calibrated device as reference |
| LIST SWEEP FUNCTION | A maximum of ten frequencies or test signal levels can be programmed. Single or sequential testing can be performed. When Opt 001 is installed, dc voltage bias testing can also be performed. |
| COMPARATOR | Ten-bin sorting for the primary measurement parameter. IN/OUT for the secondary measurement parameter. |
| Bin Count | 0 to 999999 |
| List Sweep Comparator | HIGH/IN/LOW decision output for each measurement point in the list sweep table |
| OTHER FUNCTIONS | |
| STORE/LOAD | Ten instrument setups can be stored/loaded from the internal non-volatile memory. Ten additional setups can also be stored/loaded from a memory card. |
| HP-IB | All instrument control settings, measured values, comparator limits, list sweep table, and self-test results. |
| Memory | The memory buffer can store a maximum of 128 measurement results and output the data over HP-IB, ASCII, and 64-bit binary data formats. |
| GENERAL SPECIFICATIONS | |
| Power Requirements | 100/120/220 V ± 10%, 240 V + 5%/ -10%, 47 to 66Hz |
| Power Consumption | 200 VA max |
| Size | 426 mm W X 177 mm H X 498 mm D (16.77 in X 6.97 in X 19.61 in) |
| Weight | Approximately 16 kg (35.2 lb) |
$20.00 Minimum on Total Order
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