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The Hioki 3522-50 and Hioki 3532-50 LCR HiTESTER has been improved with
the power for maximum high speed measurements of 5 ms (4 times that of
current models), which means that line tact times can be further reduced for
increased line efficiency.
The Hioki 3522-50 offers DC and a range from 1 mHz to 100 kHz, and the
Hioki 3532-50 covers the range from 42 Hz to 5MHz. Test conditions can
now come closer to a component's operating conditions. The high basic
accuracy of ±0.08%, combined with ease of use and low price give
these LCR HiTESTERS outstanding cost performance characteristics. |
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Specifications |
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3522-50 |
3532-50 |
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Measurement Parameters |
|Z|,
|Y|, θ, Rp (DCR), Rs (ESR, DCR). G, X, B, Cp, Cs, Lp, Ls, D, Q |
|Z|,
|Y|, θ, Rp, Rs (ESR), G, X, B, Cp, Cs, Lp, Ls, D, Q |
Measurement Ranges:
|Z|, R, X |
10.00 mΩ to 200.00 MΩ
(depending on measurement frequency and signal levels) |
|
θ |
-180.00° to +180.00° |
|
C |
0.3200
pF to 1.0000 F |
0.3200
pF to 370.00 mF |
|
L |
16.000 nH to 750.00 kH |
|
D |
0.00001 to 9.99999 |
|
Q |
0.01 to 999.99 |
|
|Y|, G,
B |
5.0000 nS to 99.999 S |
|
Basic Accuracy |
Z: ±0.08% rdg.
θ ± 0.05° |
|
Measurement Frequency |
DC, 1 mHz to 100 kHz |
42 Hz to 5 MHz |
|
Measurement Signal Levels |
10 mV to 5 V rms /10μA to 100 mA rms
|
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Output Impedance |
50Ω |
|
Display
Screen |
LCD
with backlight / 99999 (full 5 digits) |
Measurement Time
(Typical Values For Displaying |Z|) |
Fast: 5ms
Normal: 16ms
Slow 1: 88ms
Slow 2: 828ms |
Fast: 5ms
Normal: 21ms
Slow 1: 72ms
Slow 2: 140ms |
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Settings In Memory |
Max. 30
Sets |
|
Comparator Functions |
HI/IN/LO
settings for two measurement parameters; percentage, Δ%, or absolute
value settings |
|
DC Bias |
External
DC bias ± 40 V max. (Option) |
|
External Printer |
9442
Printer (Option) |
|
External Interfaces |
GP-IB or
RS-232C (Options), external I/O for sequencer use |
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Power Source |
100, 120,
220 or 240 V(±10%) AC (selectable), 50/60 Hz |
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Maximum Rated Power |
40 VA Approx. |
50 VA Approx. |
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